Reliability physics 1980 :
18th annual proceedings, Las Vegas, Nevada, April 8-10, 1980 /
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

Description

Meeting Name

International Reliability Physics Symposium Las Vegas, Nev.) 1980 : (18th :

Related Names

IEEE Reliability Society
IEEE Electron Devices Society

Language(s)

English

Published

New York : Electron Devices Society and Reliability Society of the Institute of Electrical and Electronics Engineers, c1980

Subjects

Integrated circuits > Integrated circuits / Testing > Integrated circuits / Testing / Congresses
Integrated circuits > Integrated circuits / Reliability > Integrated circuits / Reliability / Congresses
Semiconductors > Semiconductors / Testing > Semiconductors / Testing / Congresses
Semiconductors > Semiconductors / Reliability > Semiconductors / Reliability / Congresses

Physical Description

vii, 339 p. : ill., ports. ; 28 cm

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