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800915s1980 nyuac b 100 0 eng d |
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‡a79092901
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‡aTK7870
‡b.I578 1980
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⊔ |
‡a(OCoLC)6714129
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‡aInternational Reliability Physics Symposium
‡n(18th :
‡d1980 :
‡cLas Vegas, Nev.)
|
245 |
1 |
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‡aReliability physics 1980 :
‡b18th annual proceedings, Las Vegas, Nevada, April 8-10, 1980 /
‡csponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
|
260 |
⊔ |
⊔ |
‡aNew York :
‡bElectron Devices Society and Reliability Society of the Institute of Electrical and Electronics Engineers,
‡cc1980
|
300 |
⊔ |
⊔ |
‡avii, 339 p. :
‡bill., ports. ;
‡c28 cm
|
538 |
⊔ |
⊔ |
‡aMode of access: Internet.
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‡aIntegrated circuits
‡xTesting
‡vCongresses
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‡aIntegrated circuits
‡xReliability
‡vCongresses
|
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⊔ |
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‡aSemiconductors
‡xTesting
‡vCongresses
|
650 |
⊔ |
0 |
‡aSemiconductors
‡xReliability
‡vCongresses
|
710 |
2 |
⊔ |
‡aIEEE Reliability Society
|
710 |
2 |
⊔ |
‡aIEEE Electron Devices Society
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⊔ |
‡a009671473
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‡a20120815102926.0
‡b2023-08-30T18:14:36Z
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‡aSDR-UCSD
‡dIII - MILLENIUM
‡lloader.pl-001-001
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