Total-dose hardness assurance guidelines for semiconductor devices and microcircuits /
Department of Defense.

Description

Related Names

United States. Dept. of Defense.

Language(s)

English

Published

Washington, D.C. : Dept. of Defense, 1985-

Subjects

Hardness > Hardness / Testing.
Radiation > Radiation / Testing.
Microelectronics > Microelectronics / Design and construction.
Semiconductors > Semiconductors / Design and construction.
Integrated circuits > Integrated circuits / Design and construction.

Physical Description

1 v. (loose-leaf) : ill. ; 28 cm.

Locate a Print Version

Find in a library

Viewability