Total-dose hardness assurance guidelines for semiconductor devices and microcircuits

LDR 01018nam a22002531a 4500
001 009422070
003 MiAaHDL
005 20100825000000.0
006 m d
007 cr bn ---auaua
008 890602s1985 xx 000 0 eng d
035 ⊔ ⊔ ‡asdr-pst.a433831
035 ⊔ ⊔ ‡a(OCoLC)81750731
035 ⊔ ⊔ ‡aLIAS544842
040 ⊔ ⊔ ‡aPSt ‡cPSt ‡dWaOLN
245 0 0 ‡aTotal-dose hardness assurance guidelines for semiconductor devices and microcircuits / ‡cDepartment of Defense.
260 ⊔ ⊔ ‡aWashington, D.C. : ‡bDept. of Defense, ‡c1985-
300 ⊔ ⊔ ‡a1 v. (loose-leaf) : ‡bill. ; ‡c28 cm.
490 ⊔ 0 ‡aMilitary handbook ; ‡vMIL-HDBK-279
504 ⊔ ⊔ ‡aIncludes bibliographical references.
538 ⊔ ⊔ ‡aMode of access: Internet.
650 ⊔ 0 ‡aHardness ‡xTesting.
650 ⊔ 0 ‡aRadiation ‡xTesting.
650 ⊔ 0 ‡aMicroelectronics ‡xDesign and construction.
650 ⊔ 0 ‡aSemiconductors ‡xDesign and construction.
650 ⊔ 0 ‡aIntegrated circuits ‡xDesign and construction.
710 1 ⊔ ‡aUnited States. ‡bDept. of Defense.
740 0 ⊔ ‡aMilitary handbook, total-dose hardness assurance guidelines for semiconductor devices and microcircuits.
CID ⊔ ⊔ ‡a009422070
DAT 0 ⊔ ‡b20100825000000.0
DAT 1 ⊔ ‡a20120815062653.0 ‡b2025-01-29T18:55:40Z
CAT ⊔ ⊔ ‡aSDR-PST ‡dUNKNOWN ‡lloader.pl-001-001
FMT ⊔ ⊔ ‡aBK
HOL ⊔ ⊔ ‡0sdr-pst.a433831 ‡apst ‡bSDR ‡cPST ‡ppst.000015084576 ‡sPST ‡1a433831
974 ⊔ ⊔ ‡bPST ‡cPST ‡d20250129 ‡sgoogle ‡upst.000015084576 ‡y1985 ‡ric ‡qbib ‡tnon-US bib date1 >= 1930