Scanning electron microscope examination of wire bonds from high-reliability devices /
Kathryn O. Leedy.

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Main Author
Leedy, Kathryn O.
Language(s)
English
Published
[Washington] : U.S. National Bureau of Standards : 1973.
Subjects
Scanning electron microscopes.
Metal bonding.
Physical Description
vi, 28 p. : ill. ; 26 cm.
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