Atomic resolution microscopy :
atomic imaging and manipulation (AIM) for advanced materials : NSF panel report.

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Related Names
National Science Foundation (U.S.)
Language(s)
English
Published
Washington, D.C. : National Science Foundation, 1993.
Subjects
Surfaces (Technology) > Analysis.
Electron microscopy > United States.
Scanning probe microscopy > United States.
Note
"NSF 93-73".
"April 1993".
Physical Description
viii, 51 p. : ill. (some col.) ; 28 cm.
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