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| 035 | ⊔ | ⊔ | ‡asdr-pst.a1620410 |
| 035 | ⊔ | ⊔ | ‡a(OCoLC)316826474 |
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| 245 | 0 | 0 | ‡aAtomic resolution microscopy : ‡batomic imaging and manipulation (AIM) for advanced materials : NSF panel report. |
| 260 | ⊔ | ⊔ | ‡aWashington, D.C. : ‡bNational Science Foundation, ‡c1993. |
| 300 | ⊔ | ⊔ | ‡aviii, 51 p. : ‡bill. (some col.) ; ‡c28 cm. |
| 500 | ⊔ | ⊔ | ‡a"NSF 93-73". |
| 500 | ⊔ | ⊔ | ‡a"April 1993". |
| 538 | ⊔ | ⊔ | ‡aMode of access: Internet. |
| 650 | ⊔ | 0 | ‡aSurfaces (Technology) ‡xAnalysis. |
| 650 | ⊔ | 0 | ‡aElectron microscopy ‡zUnited States. |
| 650 | ⊔ | 0 | ‡aScanning probe microscopy ‡zUnited States. |
| 710 | 2 | ⊔ | ‡aNational Science Foundation (U.S.) |
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| 974 | ⊔ | ⊔ | ‡bPST ‡cPST ‡d20240109 ‡sgoogle ‡upst.000022557094 ‡y1993 ‡ric ‡qbib ‡tnon-US bib date1 >= 1930 |