Microelectronic test patterns: an overview /
[by] Martin G. Buehler.

APA Citation

Buehler, M. G., United States. National Bureau of Standards., United States. Defense Nuclear Agency., United States. Defense Advanced Research Projects Agency. (1974). Microelectronic test patterns: an overview. [Washington, D.C.]: National Bureau of Standards; [for sale by the Supt. of Docs., U.S. Govt. Print. Off.].

MLA Citation

Buehler, Martin G, United States. National Bureau of Standards, United States. Defense Nuclear Agency, and United States. Defense Advanced Research Projects Agency. Microelectronic Test Patterns: an Overview. [Washington, D.C.]: National Bureau of Standards; [for sale by the Supt. of Docs., U.S. Govt. Print. Off.], 1974.