ARPA/NBS workshop III :
test patterns for integrated circuits /
Harry A. Schafft, editor.

Description

Main Author: Schafft, Harry A.
Language(s): English
Published: Washington : U.S. Dept. of Commerce, National Bureau of Standards : 1976.
Subjects: Industrie électronique > Industrie électronique / Qualité > Industrie électronique / Qualité / Contrôle > Industrie électronique / Qualité / Contrôle / Congrès.
Circuits intégrés > Circuits intégrés / Essais > Circuits intégrés / Essais / Congrès.
Automatic data collection systems > Automatic data collection systems / Congresses.
Electronic industries > Electronic industries / Quality control > Electronic industries / Quality control / Congresses.
Integrated circuits > Integrated circuits / Testing > Integrated circuits / Testing / Congresses.
Note: Consists of synopses of talks and discussions presented at the workshop held Sept. 6, 1974 in Scottsdale, Ariz.
Physical Description: v, 46 p. : ill. ; 26 cm.
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