ARPA/NBS workshop III :
test patterns for integrated circuits /
Harry A. Schafft, editor.

APA Citation

Schafft, H. A. (1976). ARPA/NBS workshop III: test patterns for integrated circuits. Washington: U.S. Dept. of Commerce, National Bureau of Standards .

MLA Citation

Schafft, Harry A. ARPA/NBS Workshop III: Test Patterns for Integrated Circuits. Washington: U.S. Dept. of Commerce, National Bureau of Standards , 1976.

Warning: These citations may not always be complete (especially for serials).