Ultraviolet and X-ray detection, spectroscopy, and polarimetry III :
19-20 July 1999, Denver, Colorado /
Silvano Fineschi, Bruce E. Woodgate, Randy A. Kimble, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.

Description

Related Names

Kimble, Randy A. (Randy Alan)
Woodgate, Bruce.
Fineschi, Silvano.
Society of Photo-Optical Instrumentation Engineers.

Language(s)

English

Published

Bellingham, Wash., USA : SPIE, c1999.

Subjects

Ultraviolet detectors > Ultraviolet detectors / Congresses.
Ultraviolet astronomy > Ultraviolet astronomy / Instruments > Ultraviolet astronomy / Instruments / Congresses.
X-ray astronomy > X-ray astronomy / Instruments > X-ray astronomy / Instruments / Congresses.
Polarimetry > Polarimetry / Congresses.

Note

Earlier conference titled: X-ray and ultraviolet spectroscopy and polarimetry.

Physical Description

vii, 288 p. : ill. ; 28 cm.

ISBN

0819432504

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