X-ray and EUV/FUV spectroscopy and polarimetry :
11-12 July, 1995, San Diego, California /
Silvano Fineschi, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering.

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Related Names: Fineschi, Silvano.
Society of Photo-optical Instrumentation Engineers.
Language(s): English
Published: Bellingham, Wash., USA : SPIE, c1995.
Subjects: Polarimetry > Polarimetry / Congresses.
Astronomical spectroscopy > Astronomical spectroscopy / Congresses.
Ultraviolet spectroscopy > Ultraviolet spectroscopy / Congresses.
X-ray spectroscopy > X-ray spectroscopy / Congresses.
Physical Description: vii, 284 p. : ill. ; 28 cm.
ISBN: 0819418765
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