International Workshop on Statistical Metrology :
[proceedings] : IWSM.

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Meeting Name
International Workshop on Statistical Metrology.
Related Names
Ōyō Butsuri Gakkai.
IEEE Electron Devices Society.
Language(s)
English
Published
Piscataway, NJ : IEEE,
Subjects
Semiconductors > Measurement > Statistical methods > Congresses.
Semiconductors > Characterization > Statistical methods > Congresses.
Note
Description based on: 2nd (June 8, 1997).
Sponsored by IEEE Electron Devices Society, in cooperation with Japan Society of Applied Physics ... [et al.].
Physical Description
v. : ill. ; 28 cm.
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Item Link Original Source
Limited (search only)   00TH8489 2000 University of Michigan
Limited (search only)   01TH8550 2001 University of Michigan
Limited (search only)   97TH8246 1997 University of Michigan
Limited (search only)   98EX113 1998 University of Michigan
Limited (search only)   99TH8391 1999 University of Michigan