International Workshop on Statistical Metrology :
[proceedings] : IWSM.
APA Citation
International Workshop on Statistical Metrology., Ōyō Butsuri Gakkai., IEEE Electron Devices Society. International Workshop on Statistical Metrology: [proceedings] : IWSM. Piscataway, NJ: IEEE.
MLA Citation
International Workshop on Statistical Metrology, Ōyō Butsuri Gakkai, and IEEE Electron Devices Society. International Workshop On Statistical Metrology: [proceedings] : IWSM. Piscataway, NJ: IEEE,
Warning: These citations may not always be complete (especially for serials).