Advances and applications in the metallography and characterization of materials and microelectronic components :
proceedings of the Twenty-eighth Annual Technical Meeting of the International Metallographic Society /
edited by D.W. Stevens ... [et al.].

Description

Corporate Author

International Metallographic Society. Technical Meeting

Related Names

Stevens, D. W.

Language(s)

English

Published

Columbus, Ohio : International Metallographic Society ; c1996.

Subjects

Microelectronics > Microelectronics / Materials > Microelectronics / Materials / Microscopy > Microelectronics / Materials / Microscopy / Congresses.
Metallography > Metallography / Industrial applications > Metallography / Industrial applications / Congresses.
Metallography > Metallography / Congresses.

Note

Meeting held in Albuquerque, New Mexico, July 23-26, 1995.

Physical Description

xi, 318 p. : ill. ; 29 cm.

ISBN

0871705702

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