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Advances and applications in the metallography and characterization of materials and microelectronic components :
proceedings of the Twenty-eighth Annual Technical Meeting of the International Metallographic Society /
edited by D.W. Stevens ... [et al.].

APA Citation

International Metallographic Society. Technical Meeting 1995 : Albuquerque, N., Stevens, D. W. (1996). Advances and applications in the metallography and characterization of materials and microelectronic components: proceedings of the Twenty-eighth Annual Technical Meeting of the International Metallographic Society. Columbus, Ohio: International Metallographic Society .

MLA Citation

International Metallographic Society. Technical Meeting 1995 : Albuquerque, N.M.), and D. W Stevens. Advances And Applications In the Metallography And Characterization of Materials And Microelectronic Components: Proceedings of the Twenty-eighth Annual Technical Meeting of the International Metallographic Society. Columbus, Ohio: International Metallographic Society , 1996.

Warning: These citations may not always be complete (especially for serials).

Advances and applications in the metallography and characterization of materials and microelectronic components : proceedings of the Twenty-eighth Annual Technical Meeting of the International Metallographic Society / edited by D.W. Stevens ... [et al.].

APA Citation

MLA Citation

Advances and applications in the metallography and characterization of materials and microelectronic components :
proceedings of the Twenty-eighth Annual Technical Meeting of the International Metallographic Society /
edited by D.W. Stevens ... [et al.].