Fundamentals of surface and thin film analysis /
Leonard C. Feldman, James W. Mayer.

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Main Author: Feldman, Leonard C.
Related Names: Mayer, James W., 1930-
Language(s): English
Published: New York : North-Holland, c1986.
Subjects: Thin films > Thin films / Analysis.
Surfaces (Technology) > Surfaces (Technology) / Analysis
Physical Description: xviii, 352 p. : ill. ; 24 cm.
ISBN: 0444009892
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Limited (search only)	University of Michigan

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