Reliability and degradation :
semiconductor devices and circuits /
edited by M.J. Howes, D.V. Morgan.

Description

Tools

Cite this Export citation file
Related Names
Morgan, D. V.
Howes, M. J.
Language(s)
English
Published
Chichester ; J. Wiley, c1981.
Subjects
Semiconductors > Reliability.
Note
Includes bibliographical references and index.
Physical Description
xii, 444 p. : ill. ; 24 cm.
ISBN
0471280283
Locate a Print Version
Find in a library

Viewability

Item Link Original Source
Limited (search only)   University of Michigan
Limited (search only)   University of California