Reliability and degradation : semiconductor devices and circuits

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245 0 0 ‡aReliability and degradation : ‡bsemiconductor devices and circuits / ‡cedited by M.J. Howes, D.V. Morgan.
260 ⊔ ⊔ ‡aChichester ; ‡aNew York : ‡bJ. Wiley, ‡cc1981.
300 ⊔ ⊔ ‡axii, 444 p. : ‡bill. ; ‡c24 cm.
490 0 ⊔ ‡aWiley series in solid state devices and circuits
500 ⊔ ⊔ ‡aIncludes bibliographical references and index.
538 ⊔ ⊔ ‡aMode of access: Internet.
650 ⊔ 0 ‡aSemiconductors ‡xReliability.
700 1 ⊔ ‡aMorgan, D. V.
700 1 ⊔ ‡aHowes, M. J.
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