Some specialized attachments for the Siemens x-ray diffractometer /
John J. Renton, William L. Baun.

Description

Main Author

Renton, John J.

Related Names

Baun, William L., author.
United States. Air Force.

Language(s)

English

Published

Wright-Patterson Air Force Base, Ohio : Air Force Materials Laboratory, Aeronautical Systems Division, AIr Force Systems Command, United States Air Force, 1963.

Subjects

X-rays > X-rays / Equipment and supplies.
X-ray diffractometer.

Summary

Several devices are described which were designed to be used with the Siemens horizontal diffractometer to accomplish specific tasks required in the basic and applied research programs of the AF Materials Laboratory. Instruments which are shown include a low temperature mount for polycrystalline materials, a low temperature mount for single crystals, a simple fiber mount, a two-circle orienter, a true focusing device after the Seemann-Bohlin geometry, and a proposed high temperature attachment. Included are typical applications of the devices to illustrate the functions for which the instruments were designed.

Note

"June 1963."

Physical Description

vi, 41 pages : illustrations ; 28 cm.

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