Spreading resistance analysis for silicon layers with nonuniform resistivity /
David H. Dickey and James R. Ehrstein.

APA Citation

Dickey, D. H., Ehrstein, J. R., United States. National Bureau of Standards. (1979). Spreading resistance analysis for silicon layers with nonuniform resistivity. Washington, D.C.: U.S. Dept. of Commerce, National Bureau of Standards .

MLA Citation

Dickey, David H, James R Ehrstein, and United States. National Bureau of Standards. Spreading Resistance Analysis for Silicon Layers With Nonuniform Resistivity. Washington, D.C.: U.S. Dept. of Commerce, National Bureau of Standards , 1979.