Zero displacement, liquid nitrogen level monitor for semiconductor detectors

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040 ‡aX6@ ‡beng ‡cX6@ ‡dOCLCQ ‡dTRAAL
049 ‡aMAIN
086 0 ‡aY 3.At 7:22/ARH-2247
100 1 ‡aZimmer, William H., ‡eauthor.
245 1 0 ‡aZero displacement, liquid nitrogen level monitor for semiconductor detectors / ‡cby W.H. Zimmer.
264 1 ‡aRichland, Washington : ‡bAtlantic Richfield Hanford Company, ‡c1972.
300 ‡a17 pages : ‡billustrations ; ‡c28 cm.
336 ‡atext ‡btxt ‡2rdacontent
337 ‡aunmediated ‡bn ‡2rdamedia
338 ‡avolume ‡bnc ‡2rdacarrier
490 0 ‡aARH (Series) ‡v2247
490 0 ‡aAEC research and development report
500 ‡a"ARH-2247; UC-4, Chemistry (TID 4500, 57th Ed.)."
500 ‡a"January 1972."
504 ‡aIncludes bibliographical references (page 7).
536 ‡aPrepared for the U.S. Atomic Energy Commission under contract ‡bAT (45-1)-2130.
538 ‡aMode of access: Internet.
650 0 ‡aSemiconductors.
650 0 ‡aLithium compounds.
650 0 ‡aGermanium compounds.
650 0 ‡aLiquid nitrogen.
650 0 ‡aSemiconductor nuclear counters.
650 0 ‡aIonizing radiation ‡xMeasurement.
710 2 ‡aU.S. Atomic Energy Commission, ‡esponsor.
710 2 ‡aAtlantic Richfield Hanford Company, ‡eissuing body.
730 0 ‡aTechnical Report Archive & Image Library (TRAIL)
899 ‡a39015095279264
CID ‡a102765570
DAT 0 ‡b20230928000000.0
DAT 1 ‡a20230928062550.0 ‡b2023-12-31T18:40:36Z
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974 ‡bMIU ‡cGWLA ‡d20231231 ‡sgoogle ‡umdp.39015095279264 ‡y1972 ‡ric ‡qbib ‡tnon-US bib date1 >= 1929