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‡a(OCoLC)50256822
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‡aLu, Ryan P.
‡q(Ryan Paul)
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‡aIII-V compound semiconductor dopant profiling using scanning spreading resistance microscopy /
‡cby Ryna P. Lu
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‡c2002
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‡axix, 156 leaves :
‡billustrations ;
‡c28 cm
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‡atext
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‡aunmediated
‡2rdamedia
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‡avolume
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‡aVita
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‡bPh. D.
‡cUniversity of California, San Diego
‡d2002
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⊔ |
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‡aIncludes bibliographical references
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⊔ |
⊔ |
‡aAlso issued online
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‡aMode of access: Internet.
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‡aDissertations, Academic
‡zUCSD
‡xElectrical engineering.
‡2local
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