Possible measurement errors in calibrated AVHRR data /
Robert Paul d'Entremont, Thomas J. Kleespies.
Description
- Language(s)
-
English
- Published
-
Hanscom AFB, Massachusetts : Air Force Geophysics Laboratory, Air Force Systems Command, United States Air Force, 1988.
- Summary
-
Visible and infrared meteorological satellite data are a primary source of global cloud observations. Such data are calibrated in order to provide its users with a method for converting from 'raw' measurements, called counts, to physically sensible measurements such as albedo or brightness temperature. This report describes the procedure for converting National Oceanic and Atmospheric Administration Advanced Very High Resolution Radiometer (NOAA AVHRR) raw counts to albedos and brightness temperatures. This procedure involves the use of 'calibration coefficients' that help define the relationship between the raw counts and the physical measurements they represent. Such relationships are referred to as 'look-up-tables'. In theory, calibration coefficients (and therefore look-up tables) do not change noticeably from one scanline of satellite data to the next. This makes feasible the generation of a constant look-up table that can be used over long periods of time for all data. In practice, calibration coefficients can and often do change from one scan to the next. These changes imply accuracy errors in measured brightness temperatures that are significant for some satellite data analysis algorithms; others are less severely affected. This report addresses the potential errors that can be expected when using constant look-up tables, i.e., by assuming that sensor calibration does not change from one scanline to the next.
- Note
-
Research supported by the Air Force Geophysics Laboratory, United States Air Force, Hanscom AFB, Massachusetts.
Atmospheric Sciences Division Project 6670.
ADA198342 (from http://www.dtic.mil).
"1 April 1988."
- Physical Description
-
iv, 21 pages :
illustrations ;
28 cm.
Viewability
| Item Link |
Original Source |
|
Full view
|
Technical Report Archive & Image Library
|