A two-wave panel study of the relationships among hardiness, acculturation, stress, and psychological distress in Chinese Americans
by Ky-Van Lee

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Main Author: Lee, Ky-Van
Language(s): English
Published: 2002
Subjects: Tesis y escritos académicos
Thèses et écrits académiques.
Academic theses.
Academic theses
dissertations.
Note: Degree granted in Psychology
Physical Description: 105 leaves illustrations
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