Reliability physics 1973 :
11th annual proceedings, Lac Vegas, Nevada, April 3-5, 1973 /
sponsored by the IEEE Electron Devices Group and the IEEE Reliability Group.

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Meeting Name
International Reliability Physics Symposium Las Vegas, Nev.) 1973 : (11th :
Related Names
IEEE Reliability Group.
Institute of Electrical and Electronics Engineers. Electron Devices Group.
Language(s)
English
Published
New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.
Subjects
Electronic apparatus and appliances > Testing > Congresses.
Electronic apparatus and appliances > Reliability > Congresses.
Note
"IEEE catalog no. 73 CHO 755-9 PHY."
Physical Description
318 p. : ill. ; 28 cm.
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