Reliability physics 1973 :
11th annual proceedings, Lac Vegas, Nevada, April 3-5, 1973 /
sponsored by the IEEE Electron Devices Group and the IEEE Reliability Group.

Description

Meeting Name

International Reliability Physics Symposium Las Vegas, Nev.) 1973 : (11th :

Related Names

IEEE Reliability Group.
Institute of Electrical and Electronics Engineers. Electron Devices Group.

Language(s)

English

Published

New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.

Subjects

Electronic apparatus and appliances > Electronic apparatus and appliances / Testing > Electronic apparatus and appliances / Testing / Congresses.
Electronic apparatus and appliances > Electronic apparatus and appliances / Reliability > Electronic apparatus and appliances / Reliability / Congresses.

Note

"IEEE catalog no. 73 CHO 755-9 PHY."

Physical Description

318 p. : ill. ; 28 cm.

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