Modeling and simulation of hot-carrier effects in MOS devices and circuits /
by Peter Maurice Lee.

Description

Main Author

Lee, Peter M. (Peter Maurice)

Language(s)

English

Published

1990.

Subjects

University of California, Berkeley. > University of California, Berkeley. / Dept. of Electrical Engineering and Computer Sciences > University of California, Berkeley. / Dept. of Electrical Engineering and Computer Sciences / Dissertations.

Physical Description

iv, 202 leaves : ill. ; 18 cm.

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