Catalog Record: A study of temperature measurement precision in Debye-Scherrer specimens during high temperature X-ray diffraction measurement of thermal expansion | HathiTrust Digital Library

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A study of temperature measurement precision in Debye-Scherrer specimens during high temperature X-ray diffraction measurement of thermal expansion /
by R.G. Merryman.

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Main Author: Merryman, R. G.
Language(s): English
Published: Los Alamos, N.M. : Los Alamos Scientific Laboratory of the University of California, 1964.
Subjects: X-rays > X-rays / Diffraction > X-rays / Diffraction / Measurement.
Note: "TID-4500, (29th Ed.)"
"UC-25, Metals, Ceramics, and Materials"
"LA-2687"
"Report distributed: May 22, 1964."
"Report written: June 1962."
Physical Description: viii, 98 p. : ill. ; 28 cm.
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