Metrizability and pattern recognition /
by Peter Duran.

Description

Main Author

Duran, Peter.

Related Names

Electronics Research Center (U.S.)

Language(s)

English

Published

Washington, D.C. : National Aeronautics and Space Administration, 1967.

Subjects

Pattern perception.
Metric spaces.

Note

"October 1967."
Full text also available online. Address as of 11/9/2010:

Physical Description

5 p. : ill. ; 26 cm.

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