Spectral emissivity of highly doped silicon /
by Curt H. Liebert and Ralph D. Thomas.

Description

Main Author

Liebert, Curt H.

Related Names

Thomas, Ralph D.
Lewis Research Center.

Language(s)

English

Published

Washington, D.C. : National Aeronautics and Space Administration ; [1968]

Subjects

Emissivity > Emissivity / Measurement.
Doped semiconductors > Doped semiconductors / Electric properties.
Doped semiconductors > Doped semiconductors / Optical properties.
Doped semiconductors > Doped semiconductors / Spectra > Doped semiconductors / Spectra / Measurement.
Silicon > Silicon / Electric properties.
Silicon > Silicon / Optical properties.
Silicon > Silicon / Spectra > Silicon / Spectra / Measurement.

Note

Prepared at Lewis Research Center.
"April 1968"--Cover.

Physical Description

25 p. : ill. ; 27 cm.

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