The use of the electron probe microanalyzer in materials research and development

LDR 01171cam a2200301Ka 4500
001 011442458
003 MiAaHDL
005 20141009010000.0
006 m d
007 cr bn ---auaua
008 070615s1968 dcua b f000 0 eng d
035 ⊔ ⊔ ‡asdr-uiuc6395211
035 ⊔ ⊔ ‡a(OCoLC)144577376
040 ⊔ ⊔ ‡aAD# ‡cAD# ‡dEGM
041 0 ⊔ ‡aeng
049 ⊔ ⊔ ‡aUIUU
086 0 ⊔ ‡aNAS 1.14:D-4526
088 ⊔ ⊔ ‡aNASA-TN-D-4526
100 1 ⊔ ‡aKobren, Lawrence.
245 1 4 ‡aThe use of the electron probe microanalyzer in materials research and development / ‡cLawrence Kobren.
246 3 ⊔ ‡aNASA TN D-4526
260 ⊔ ⊔ ‡aWashington, D. C. : ‡bNational Aeronautics and Space Administration ; ‡aSpringfield, Va. : ‡bfor sale by the Clearinghouse for Federal Scientific and Technical Information, ‡c1968.
300 ⊔ ⊔ ‡aiii, 23 p. : ‡bill. ; ‡c26 cm.
490 ⊔ 0 ‡aNASA technical note ; ‡vD-4526
500 ⊔ ⊔ ‡aCover title.
500 ⊔ ⊔ ‡a"June 1968."
504 ⊔ ⊔ ‡aIncludes bibliographical references (p. 22-23).
538 ⊔ ⊔ ‡aMode of access: Internet.
650 ⊔ 0 ‡aElectron probe microanalysis ‡xResearch.
710 2 ⊔ ‡aGoddard Space Flight Center.
710 1 ⊔ ‡aUnited States. ‡bNational Aeronautics and Space Administration.
CID ⊔ ⊔ ‡a011442458
DAT 0 ⊔ ‡a20101104140709.0 ‡b20141009010000.0
DAT 1 ⊔ ‡a20141112165512.0 ‡b2025-01-02T19:13:44Z
DAT 2 ⊔ ‡a2025-01-02T18:30:02Z
CAT ⊔ ⊔ ‡aSDR-UIUC ‡dUNKNOWN ‡lloader.pl-003-020
FMT ⊔ ⊔ ‡aBK
HOL ⊔ ⊔ ‡0sdr-uiuc6395211 ‡auiug ‡bSDR ‡cUIUC ‡puiug.30112106914259 ‡sUIU ‡16395211
974 ⊔ ⊔ ‡bUIU ‡cUIUC ‡d20250102 ‡sgoogle ‡uuiug.30112106914259 ‡y1968 ‡rpd ‡qbib ‡tUS fed doc