Effects of specimen preparation on the accuracy of electromagnetic property measurements of solid materials with an automatic network analyzer

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035 ‡asdr-uiuc6368142
035 ‡a(OCoLC)36102324
040 ‡aABC ‡cABC ‡dOCLCQ
049 ‡aUIUU
086 0 ‡aNAS 1.15:87628
090 ‡aTL521.3.T4 ‡bA3 no. 87628
100 1 ‡aLong, Edward R.
245 1 0 ‡aEffects of specimen preparation on the accuracy of electromagnetic property measurements of solid materials with an automatic network analyzer / ‡cEdward R. Long, Jr.
260 ‡aWashington, D.C. : ‡bNational Aeronautics and Space Administration, Scientific and Technical Information Branch ; ‡aSpringfield, Va. : ‡bFor sale by the National Technical Information Service, ‡c1986.
300 ‡a20 p. : ‡bill. ; ‡c28 cm.
490 0 ‡aNASA technical memorandum ; ‡v87628
500 ‡aPrepared at Langley Research Center.
500 ‡a"February 1986."
538 ‡aMode of access: Internet.
650 0 ‡aMaterials ‡xTesting.
650 0 ‡aMaterials ‡xElectric properties ‡xMeasurement.
650 0 ‡aElectric network analyzers.
710 2 ‡aLangley Research Center.
CID ‡a011427155
DAT 0 ‡a20101011114817.0 ‡b20141013010000.0
DAT 1 ‡a20141112173021.0 ‡b2020-04-04T18:00:34Z
DAT 2 ‡a2020-04-04T17:30:02Z
CAT ‡aSDR-UIUC ‡dUNKNOWN ‡lloader.pl-003-020
FMT ‡aBK
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