Methods of measurement for semiconductor materials, process control and devices :
quarterly report, Oct. 1 to Dec. 31, 1972 /
ed.: W. Murray Bullis.
APA Citation
Bullis, W. Murray. (1973). Methods of measurement for semiconductor materials, process control and devices: quarterly report, Oct. 1 to Dec. 31, 1972. Washington, D.C.: National Bureau of Standards.
MLA Citation
Bullis, W. Murray. Methods of Measurement for Semiconductor Materials, Process Control And Devices: Quarterly Report, Oct. 1 to Dec. 31, 1972. Washington, D.C.: National Bureau of Standards, 1973.
Warning: These citations may not always be complete (especially for serials).