| LDR | 00781cam a2200217K 4500 | ||
| 001 | 011424143 | ||
| 003 | MiAaHDL | ||
| 005 | 20141013010000.0 | ||
| 006 | m d | ||
| 007 | cr bn ---auaua | ||
| 008 | 910218s1972 dcua f000 0 eng d | ||
| 035 | ⊔ | ⊔ | ‡asdr-uiuc6357874 |
| 035 | ⊔ | ⊔ | ‡a(OCoLC)23111626 |
| 040 | ⊔ | ⊔ | ‡aYPI ‡cYPI ‡dOCLCQ ‡dIUL ‡dOCLCG |
| 049 | ⊔ | ⊔ | ‡aUIUU |
| 086 | 0 | ⊔ | ‡aC 13.46:733 |
| 090 | ⊔ | ⊔ | ‡aQC100 ‡b.U575 no.733 |
| 100 | 1 | ⊔ | ‡aBullis, W. Murray, ‡d1930- ‡eed. |
| 245 | 1 | 0 | ‡aMethods of measurement for semiconductor materials, process control, and devices. ‡bQuarterly report. Jan. 1 - Mar. 31, 1972. |
| 260 | ⊔ | ⊔ | ‡aWashington, ‡bGPO, ‡c1972. |
| 300 | ⊔ | ⊔ | ‡avi, 52 p. ‡billus. |
| 490 | 0 | ⊔ | ‡aUnited States. National Bureau of Standards. Technical note, ‡v733 |
| 538 | ⊔ | ⊔ | ‡aMode of access: Internet. |
| CID | ⊔ | ⊔ | ‡a011424143 |
| DAT | 0 | ⊔ | ‡a20101001135857.0 ‡b20141013010000.0 |
| DAT | 1 | ⊔ | ‡a20141112173021.0 ‡b2020-04-04T17:56:11Z |
| DAT | 2 | ⊔ | ‡a2020-04-04T17:30:02Z |
| CAT | ⊔ | ⊔ | ‡aSDR-UIUC ‡dUNKNOWN ‡lloader.pl-003-020 |
| FMT | ⊔ | ⊔ | ‡aBK |
| HOL | ⊔ | ⊔ | ‡0sdr-uiuc6357874 ‡auiug ‡bSDR ‡cUIUC ‡puiug.30112106560599 ‡sUIU ‡16357874 |
| 974 | ⊔ | ⊔ | ‡bUIU ‡cUIUC ‡d20200404 ‡sgoogle ‡uuiug.30112106560599 ‡y1972 ‡rpd ‡qbib ‡tUS fed doc |