Anisotropic friction, deformation, and fracture of single-crystal silicon carbide at room temperature

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050 4 ‡aTL521.3 ‡b.N18 no. 1525
074 ‡a830-H-15 (microfiche)
086 0 ‡aNAS 1.60:1525
100 1 ‡aMiyoshi, Kazuhisa.
245 1 0 ‡aAnisotropic friction, deformation, and fracture of single-crystal silicon carbide at room temperature / ‡cKazuhisa Miyoshi and Donald H. Buckley.
260 ‡aWashington, D.C. : ‡bNational Aeronautics and Space Administration, Scientific and Technical Information Branch ; ‡a[Springfield, Va. : ‡bFor sale by the National Technical Information Service], ‡c1979.
300 ‡a21 p. : ‡bill. ; ‡c27 cm.
490 0 ‡aNASA technical paper ; ‡v1525
500 ‡a[Item 830-H-15 (microfiche); AEF/GB/MKL].
500 ‡aSubject category 27.
500 ‡a"August 1979"--Cover.
500 ‡a"Lewis Research Center."
504 ‡aIncludes bibliographical references.
538 ‡aMode of access: Internet.
650 0 ‡aSilicon carbide ‡xTesting.
650 0 ‡aFriction ‡xTesting.
700 1 ‡aBuckley, Donald H.
710 2 ‡aLewis Research Center.
710 1 ‡aUnited States. ‡bNational Aeronautics and Space Administration. ‡bScientific and Technical Information Branch.
CID ‡a011423942
DAT 0 ‡a20100930155718.0 ‡b20141013010000.0
DAT 1 ‡a20141112173021.0 ‡b2023-03-14T18:26:52Z
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