Methods of measurement for semiconductor materials, process control, and devices
quarterly report October 1 to december 31, 1968.
APA Citation
Bullis, W. Murray. (1969). Methods of measurement for semiconductor materials, process control, and devices: quarterly report October 1 to december 31, 1968. Washington: GPO.
MLA Citation
Bullis, W. Murray, 1930-. Methods of Measurement for Semiconductor Materials, Process Control, And Devices: Quarterly Report October 1 to December 31, 1968. Washington: GPO, 1969.
Warning: These citations may not always be complete (especially for serials).