| LDR | 00822cam a2200229K 4500 | ||
| 001 | 011420045 | ||
| 003 | MiAaHDL | ||
| 005 | 20141009010000.0 | ||
| 006 | m d | ||
| 007 | cr bn ---auaua | ||
| 008 | 910215s1969 dcua f000 0 eng d | ||
| 035 | ⊔ | ⊔ | ‡asdr-uiuc6345471 |
| 035 | ⊔ | ⊔ | ‡a(OCoLC)23106107 |
| 040 | ⊔ | ⊔ | ‡aYPI ‡cYPI ‡dOCLCQ ‡dLHL ‡dOCLCG |
| 049 | ⊔ | ⊔ | ‡aUIUU |
| 086 | 0 | ⊔ | ‡aC 13.46:475 |
| 090 | ⊔ | ⊔ | ‡aQC100 ‡b.U575 no.475 |
| 100 | 1 | ⊔ | ‡aBullis, W. Murray, ‡d1930- |
| 245 | 1 | 0 | ‡aMethods of measurement for semiconductor materials, process control, and devices ‡bquarterly report October 1 to december 31, 1968. |
| 260 | ⊔ | ⊔ | ‡aWashington, ‡bGPO, ‡c1969. |
| 300 | ⊔ | ⊔ | ‡aiv, 35 p. ‡billus. |
| 490 | 0 | ⊔ | ‡aUnited States. National Bureau of Standards. Technical note, ‡v475 |
| 500 | ⊔ | ⊔ | ‡a"Issued February 1969." |
| 538 | ⊔ | ⊔ | ‡aMode of access: Internet. |
| CID | ⊔ | ⊔ | ‡a011420045 |
| DAT | 0 | ⊔ | ‡a20100928081134.0 ‡b20141009010000.0 |
| DAT | 1 | ⊔ | ‡a20141112161445.0 ‡b2025-01-01T19:23:51Z |
| DAT | 2 | ⊔ | ‡a2025-01-01T18:30:02Z |
| CAT | ⊔ | ⊔ | ‡aSDR-UIUC ‡dUNKNOWN ‡lloader.pl-003-020 |
| FMT | ⊔ | ⊔ | ‡aBK |
| HOL | ⊔ | ⊔ | ‡0sdr-uiuc6345471 ‡auiug ‡bSDR ‡cUIUC ‡puiug.30112106655480 ‡sUIU ‡16345471 |
| 974 | ⊔ | ⊔ | ‡bUIU ‡cUIUC ‡d20250101 ‡sgoogle ‡uuiug.30112106655480 ‡y1969 ‡rpd ‡qbib ‡tUS fed doc |