The measurement of intelligence; an explanation of and a complete guide for the use of the Stanford revision and extension of the Binet-Simon intelligence scale.

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Main Author: Terman, Lewis M. (Lewis Madison), 1877-1956.
Language(s): English
Published: Boston : Houghton Mifflin company [c1916]
Subjects: Stanford-Binet Test.
Physical Description: 362 p.
Locate a Print Version: Find in a library

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