An empirical study of three stochastic approximation techniques applicable to sensitivity testing (U)
by Patrick L. Odell.

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Main Author: Odell, Patrick L., 1930-2020.
Language(s): English
Published: Albuquerque, N. M., U. S. Naval Weapons Evaluation Facility, 1961.
Subjects: Stochastic processes
Monte Carlo method
Monte Carlo method
Stochastic processes
Physical Description: 47 l., illus. 28 cm.
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