Spectroscopic characterization techniques for semiconductor technology III :
14-15 March 1988, Newport Beach, California /
Orest J. Glembocki, Fred H. Pollak, Fernando Ponce, chairs/editors ; sponsored by Optical Society of America, SPIE--the International Society for Optical Engineering ; cooperating organization, the Metallurgical Society
APA Citation
Ponce, F. A., Pollak, F. H., Glembocki, O. J., Metallurgical Society (U.S.)., Society of Photo-optical Instrumentation Engineers., Optical Society of America. (1988). Spectroscopic characterization techniques for semiconductor technology III: 14-15 March 1988, Newport Beach, California. Bellingham, Wash., U.S.A.: The Society.
MLA Citation
Optical Society of America, et al.. Spectroscopic Characterization Techniques for Semiconductor Technology III: 14-15 March 1988, Newport Beach, California. Bellingham, Wash., U.S.A.: The Society, 1988.
Warning: These citations may not always be complete (especially for serials).