| LDR | 01644cam a2200397Ja 4500 | ||
| 001 | 009672162 | ||
| 003 | MiAaHDL | ||
| 005 | 20110406000000.0 | ||
| 006 | m d | ||
| 007 | cr bn ---auaua | ||
| 008 | 890909s1988 waua b 101 0 eng | ||
| 010 | ⊔ | ⊔ | ‡a88060787 |
| 019 | ⊔ | ⊔ | ‡a18505947 |
| 020 | ⊔ | ⊔ | ‡a0892529814 |
| 035 | ⊔ | ⊔ | ‡asdr-ucsd.b21275257 |
| 040 | ⊔ | ⊔ | ‡aDLC ‡cDLC ‡dOCL ‡dCUS ‡dUtOrBLW |
| 050 | 0 | 0 | ‡aTK7871.85 ‡b.S726 1988 |
| 082 | 0 | 0 | ‡a621.381/52 ‡220 |
| 035 | ⊔ | ⊔ | ‡a(OCoLC)20394274 |
| 245 | 0 | 0 | ‡aSpectroscopic characterization techniques for semiconductor technology III : ‡b14-15 March 1988, Newport Beach, California / ‡cOrest J. Glembocki, Fred H. Pollak, Fernando Ponce, chairs/editors ; sponsored by Optical Society of America, SPIE--the International Society for Optical Engineering ; cooperating organization, the Metallurgical Society |
| 260 | ⊔ | ⊔ | ‡aBellingham, Wash., U.S.A. : ‡bThe Society, ‡cc1988 |
| 300 | ⊔ | ⊔ | ‡aviii, 234 p. : ‡bill. ; ‡c28 cm |
| 490 | ⊔ | 0 | ‡aProceedings of SPIE--the International Society for Optical Engineering ; ‡vv. 946 |
| 538 | ⊔ | ⊔ | ‡aMode of access: Internet. |
| 650 | ⊔ | 0 | ‡aSpectrum analysis ‡vCongresses |
| 650 | ⊔ | 0 | ‡aSemiconductors ‡xTesting ‡vCongresses |
| 700 | 1 | ⊔ | ‡aPonce, Fernando A |
| 700 | 1 | ⊔ | ‡aPollak, Fred H |
| 700 | 1 | ⊔ | ‡aGlembocki, O. J |
| 710 | 2 | ⊔ | ‡aMetallurgical Society (U.S.) |
| 710 | 2 | ⊔ | ‡aSociety of Photo-optical Instrumentation Engineers |
| 710 | 2 | ⊔ | ‡aOptical Society of America |
| CID | ⊔ | ⊔ | ‡a009672162 |
| DAT | 0 | ⊔ | ‡a20050713093134.0 ‡b20110406000000.0 |
| DAT | 1 | ⊔ | ‡a20120815102926.0 ‡b2023-06-10T17:42:28Z |
| CAT | ⊔ | ⊔ | ‡aSDR-UCSD ‡dIII - MILLENIUM ‡lloader.pl-001-001 |
| FMT | ⊔ | ⊔ | ‡aBK |
| HOL | ⊔ | ⊔ | ‡0sdr-ucsd.b21275257 ‡auc1 ‡bSDR ‡cUCSD ‡puc1.31822003191137 ‡sUC ‡1.b21275257 |
| 974 | ⊔ | ⊔ | ‡bUC ‡cUCSD ‡d20230610 ‡sgoogle ‡uuc1.31822003191137 ‡y1988 ‡ric ‡qbib ‡tUS bib date1 >= 1929 |