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| 003 | MiAaHDL | ||
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| 008 | 850828s1985 nyuac b 100 0 eng d | ||
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| 035 | ⊔ | ⊔ | ‡asdr-ucsd.b4562186x |
| 040 | ⊔ | ⊔ | ‡aRRR ‡cRRR ‡dCLU ‡dOCL ‡dKUK ‡dOCL ‡dCUS ‡dUtOrBLW |
| 090 | ⊔ | ⊔ | ‡aTK7870 ‡b.I578 1985 |
| 035 | ⊔ | ⊔ | ‡a(OCoLC)12433078 |
| 111 | 2 | ⊔ | ‡aInternational Reliability Physics Symposium ‡n(23rd : ‡d1985 : ‡cOrlando, Fla.) |
| 245 | 1 | 0 | ‡aReliability physics 1985 : ‡b23rd annual proceedings, Orlando, Florida, March 26, 27, 28, 1985 / ‡csponsored by the IEEE Electron Devices Society and the IEEE Reliability Society |
| 260 | ⊔ | ⊔ | ‡aNew York, N.Y. : ‡bElectron Devices and Reliability Societies of the Institute of Electrical and Electronic[s] Engineers, ‡cc1985 |
| 300 | ⊔ | ⊔ | ‡aviii, 252 p. : ‡bill., ports. ; ‡c28 cm |
| 538 | ⊔ | ⊔ | ‡aMode of access: Internet. |
| 650 | ⊔ | 0 | ‡aElectronic apparatus and appliances ‡xTesting ‡vCongresses |
| 650 | ⊔ | 0 | ‡aElectronic apparatus and appliances ‡xReliability ‡vCongresses |
| 710 | 2 | ⊔ | ‡aIEEE Reliability Society |
| 710 | 2 | ⊔ | ‡aIEEE Electron Devices Society |
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