Semiconductor measurement technology:
the destructive bond pull test.
John Albers, editor.

APA Citation

Albers, J. (1976). Semiconductor measurement technology: the destructive bond pull test. Washington: U.S. Dept. of Commerce, National Bureau of Standards; for sale by the Supt. of Docs., U.S. Govt. Print. Off..

MLA Citation

Albers, John. Semiconductor Measurement Technology: the Destructive Bond Pull Test. Washington: U.S. Dept. of Commerce, National Bureau of Standards; for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976.