Electron and ion microscopy and microanalysis :
principles and applications /
Lawrence E. Murr.

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Main Author: Murr, Lawrence Eugene.
Language(s): English
Published: New York : Marcel Dekker, c1982.
Subjects: Microprobe analysis.
Field ion microscopes.
Electron microscopy.
Physical Description: xiv, 793 p. : ill. ; 27 cm.
ISBN: 0824715535
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Item Link	Original Source
Limited (search only)	University of Minnesota

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