Carrier lifetime measurement by the photoconductive decay method /
Richard L. Mattis and A. James Baroody, Jr.
|Main Author:||Mattis, Richard L.|
|Related Names:||Baroody, A. James.|
Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : 1972.
Sponsored by the National Bureau of Standards and others.
"Carried out as part of the Joint Program on Methods of Measurement for Semiconductor Materials, Process Control, and Devices."
"A United States Department of Commerce publication."--Cover.
"Issued September 1972."
ix, 40 p. :
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