Catalog Record: Carrier lifetime measurement by the photoconductive decay method | HathiTrust Digital Library

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Carrier lifetime measurement by the photoconductive decay method /
Richard L. Mattis and A. James Baroody, Jr.

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Main Author: Mattis, Richard L.
Related Names: Baroody, A. James.
Language(s): English
Published: Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : 1972.
Subjects: Semiconductors.
Photoelectric cells.
Photoconductivity.
Note: Sponsored by the National Bureau of Standards and others.
"Carried out as part of the Joint Program on Methods of Measurement for Semiconductor Materials, Process Control, and Devices."
"A United States Department of Commerce publication."--Cover.
"Issued September 1972."
Physical Description: ix, 40 p. : ill. ; 26 cm.
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