Ellipsometry in the measurement of surfaces and thin films :
symposium proceedings.

APA Citation

Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films (1963 : Washington, D., Kruger, J., Stromberg, R. R., Passaglia, E. (1964). Ellipsometry in the measurement of surfaces and thin films: symposium proceedings. Washington: U.S. National Bureau of Standards.

MLA Citation

Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films (1963 : Washington, D.C.), Jerome Kruger, R. R Stromberg, and Elio Passaglia. Ellipsometry In the Measurement of Surfaces And Thin Films: Symposium Proceedings. Washington: U.S. National Bureau of Standards, 1964.

Warning: These citations may not always be complete (especially for serials).