01276nas a2200337 a 4500006895023MiAaHDL20141010010000.0m d cr bn ---auaua950126c19929999cauar1 1 a0eng d1081-7735sdr-uiuc3810345AZM-3747(OCoLC)31919718CUYCUYIAYlcnsdpTK7888.4.S85a62112Asian Test Symposium.Proceedings - Asian Test Symp.Proceedings - Asian Test SymposiumProceedings.ATS ... proceedings1992-1993Los Alamitos, Calif. :IEEE Computer Society Press,c1992-v. :ill. ;28 cm.Annual1st (Nov. 26-27, 1992)-Mode of access: Internet.Sponsored by: IEEE Computer Society Test Technology Technical Committee and various local groups.Electronic circuitsTestingCongresses.Fault-tolerant computingCongresses.Electronic digital computersCircuitsTestingCongresses.Vols. for 1993-<1994> have title:Proceedings of the ... Asian Test SymposiumIEEE Computer Society.Test Technology Technical Committee.00689502320020415165253.020141010010000.020141112172519.02025-12-15T19:22:55Z2025-12-15T18:50:03ZSDR-UIUCUNKNOWNloader.pl-003-020SEsdr-uiuc3810345uiugSDRUIUCuiug.30112043460176UIU123810345UIUUIUC20251215googleuiug.3011204346017612undbibUS bib date2 >= 1931UIUUIUC20241127googleuiug.301120507258839(2000)2000icbibUS serial item date >= 1931