Microelectronic ultrasonic bonding

LDR 01327cam a2200361 a 4500
001 006865985
003 MiAaHDL
005 20221205000000.0
006 m d
007 cr bn ---auaua
008 741119s1974 dcua b f001 0 eng
010 ‡a73600343
029 1 ‡aAU@ ‡b000000416182
029 1 ‡aNLGGC ‡b11301418X
035 ‡a(MiU)990068659850106381
035 ‡asdr-miu.990068659850106381
035 ‡asdr-uiuc253201
035 ‡z(MiU)MIU01000000000000006865985-goog
035 ‡a(OCoLC)1119404
035 ‡z(MiU)Aleph006865985
040 ‡aDLC ‡cDLC ‡dBTCTA ‡dNSBSP
049 ‡aNSBA
086 0 ‡aC 13.10:400-2
100 1 ‡aHarman, George G.
245 1 0 ‡aMicroelectronic ultrasonic bonding / ‡cGeorge G. Harman, editor.
246 1 6 ‡aSemiconductor measurement technology.
260 ‡a[Washington, D.C.] : ‡bU.S. National Bureau of Standards; [for sale by the Supt. of Docs., U.S. Govt. Print. Off.] ‡c1974.
300 ‡avi, 102 p. : ‡billus. ; ‡c26 cm.
490 0 ‡aU.S. Department of Commerce National Bureau of Standards special publication ; ‡v400-2
500 ‡a"CODEN: XNBSAV."
504 ‡aIncludes bibliographical references.
538 ‡aMode of access: Internet.
650 0 ‡aMicroelectronics.
650 0 ‡aUltrasonic welding.
710 1 ‡aUnited States. ‡bNational Bureau of Standards. ‡tSpecial publication.
899 ‡a39015077585928
CID ‡a006865985
DAT 0 ‡b20221205000000.0
DAT 1 ‡a20221206061329.0 ‡b2024-02-24T18:46:52Z
CAT ‡aSDR-MIU ‡cmiu ‡dALMA ‡lprepare.pl-004-008
FMT ‡aBK
HOL ‡0sdr-miu.990068659850106381 ‡aMiU ‡bSDR ‡cGWLA ‡f006865985 ‡pmdp.39015077585928 ‡sMIU ‡1990068659850106381
974 ‡bMIU ‡cGWLA ‡d20240224 ‡sgoogle ‡umdp.39015077585928 ‡y1974 ‡rpd ‡qbib ‡tUS fed doc
974 ‡bUIU ‡cUIUC ‡d20250101 ‡sgoogle ‡uuiug.30112104131591 ‡z400-2 ‡y1974 ‡rpd ‡qbib ‡tUS fed doc