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‡aSpreading Resistance Symposium
‡d(1974 :
‡cGaithersburg, Md.)
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‡aSpreading Resistance Symposium :
‡bproceedings of a symposium, held at the National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974 /
‡cJames R. Ehrstein, editor.
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‡aWashington :
‡bU.S. Dept. of Commerce, National Bureau of Standards :
‡bFor sale by the Supt. of Docs., U.S. Govt. Print. Off.,
‡c1974.
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‡aix, 281 p. :
‡bill. ;
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‡aSemiconductor measurement technology
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‡aNBS special publication ; 400-10
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‡a"Under the sponsorship of Committee F-1 of the American Society for Testing and Materials and the National Bureau of Standards."
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‡aIncludes bibliographical references (p. 279-281).
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‡aMode of access: Internet.
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‡aSemiconducteurs
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‡aRésistance électrique
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‡aEhrstein, James R.
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‡aUnited States.
‡bNational Bureau of Standards.
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‡aAmerican Society for Testing and Materials.
‡bCommittee F-1 on Materials for Electron Devices and Microelectronics.
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‡iOnline version:
‡aSpreading Resistance Symposium (1974 : Gaithersburg, Md.)
‡tSpreading Resistance Symposium.
‡dWashington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1974
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