Catalog Record: Thermal resistance measurements on power transistors | HathiTrust Digital Library

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Thermal resistance measurements on power transistors /
Sherwin Rubin and Frank F. Oettinger.

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Main Author: Rubin, Sherwin.
Related Names: Oettinger, Frank F. , joint author.
Language(s): English
Published: [Washington, D.C.] : U.S. Dept. of Commerce, National Bureau of Standards : 1979.
Subjects: Semiconductors > Semiconductors / Junctions.
Power transistors > Power transistors / Thermal properties.
Physical Description: vi, 62 p. : ill. ; 26 cm.
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